Prathipa. “A NOVEL APPROACH TO FUNCTIONAL VERIFICATION CLOSURE USING OPTIMAL TEST SCENARIOS IN DIGITAL CIRCUITS”. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY (IJCET) 15, no. 4 (July 29, 2024): 85–91. Accessed April 19, 2026. https://openlibindex.com/index.php/IJCET/article/view/IJCET_15_04_007.